机译:用于无嵌入式I-AlGaN / GaN的无AU-Fiave Tixaly合金接触的US-LOW接触电阻率<0.1Ω⋅mmm
Fudan Univ Sch Microelect State Key Lab ASIC & Syst Shanghai 200433 Peoples R China;
Southern Univ Sci & Technol SUSTech Sch Microelect Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech GaN Device Engn Technol Res Ctr Guangdong Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech Key Lab Third Generat Semicond Shenzhen 518055 Guangdong Peoples R China;
Southern Univ Sci & Technol SUSTech Sch Microelect Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech GaN Device Engn Technol Res Ctr Guangdong Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech Key Lab Third Generat Semicond Shenzhen 518055 Guangdong Peoples R China;
Southern Univ Sci & Technol SUSTech Sch Microelect Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech GaN Device Engn Technol Res Ctr Guangdong Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech Key Lab Third Generat Semicond Shenzhen 518055 Guangdong Peoples R China;
Southern Univ Sci & Technol SUSTech Sch Microelect Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech GaN Device Engn Technol Res Ctr Guangdong Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech Key Lab Third Generat Semicond Shenzhen 518055 Guangdong Peoples R China;
Fudan Univ Sch Microelect State Key Lab ASIC & Syst Shanghai 200433 Peoples R China;
Southern Univ Sci & Technol SUSTech Sch Microelect Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech GaN Device Engn Technol Res Ctr Guangdong Shenzhen 518055 Guangdong Peoples R China|Southern Univ Sci & Technol SUSTech Key Lab Third Generat Semicond Shenzhen 518055 Guangdong Peoples R China;
Ohmic contact; TixAly alloy; AlGaN/GaN; Au-free; non-recessed;
机译:AlGaN / GaN上的简单非凹陷和无熔丝高质量的欧姆触点:Ti / Al合金的情况
机译:Ti / Al原子比对AlGaN / GaN异质结构上非凹陷无金欧姆接触形成机理的影响
机译:通过使用Taal / Au在非凹陷I-AlGaN / GaN上使用Taal / Au的诱导致电阻通过退火诱导渗透到2D电子气体的极低电阻接触。
机译:用差示扫描量热法(DSC)表征和动力学监测n型GaN上基于Ti-Al的欧姆接触中TixAly相之间的反应
机译:低电阻率的锗硅化物接触层形成了用于纳米级CMOS的磷掺杂的硅锗合金源/漏结。
机译:具有再生欧姆接触的半绝缘Ammono-GaN衬底上的AlGaN / GaN高电子迁移率晶体管
机译:ALGAN / GAN高电子迁移率晶体管的无芳型嵌入式欧姆触点:蚀刻化学和金属方案的研究