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Degradation of cross linked polystyrene by repetitive impulse surface flashovers in vacuum

机译:真空中重复脉冲表面闪蒸降解交联聚苯乙烯

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In order to understand aging mechanism of solid insulating materialscaused by surface flashover, this paper presents the electrical degradation characteristics of cross linked polystyrene (XLPS) by repetitive impulse surface flashovers in vacuum. The surface of samples underwent flashover repeatedly under different impulse voltage situations. Each flashover voltage and current was recorded, and the flashover energy was calculated to present flashover properties under each condition. Experimental results indicate that there are different degradation phenomena of XLPS after undergoing those impulse flashovers. The flashovers with small current have positive effect on surface flashover property of insulating material. However, the large currents when flashovers occurred play a destruction role in surface properties of XLPS. It is said that finite numbers of repetitive impulse flashovers under small flashover currents removed the contaminants, water and gas on the sample surface. In addition, it represents a "conditioning" effect and stable situation of flashover properties under these situations due to removal of emission sites, micro protuberance of electrodes and sample surface, especially at the cathode triple junction. However, repetitive flashovers under high flashover current (ȦB;1 kA) led to surface degradation. This phenomena attributes to the high flashover energy changed the sample surface state, destroyed the sample surface and formed apparent carbonized channels and regions on sample surface. So flashover becomes unstable in this situation. Through summarizing and analyzing the experimental results, the flashover energy was proposed as a main factor to characterize the phenomenon of degradation by repetitive impulse flashovers in vacuum.
机译:为了了解表面闪络引起的固体绝缘材料的老化机理,本文通过真空中重复脉冲表面闪络给出了交联聚苯乙烯(XLPS)的电降解特性。样品表面在不同的脉冲电压情况下反复经历闪络。记录每个闪络电压和电流,并计算闪络能量以显示每种条件下的闪络特性。实验结果表明,XLPS在经历这些脉冲闪络后会发生不同的降解现象。小电流的闪络对绝缘材料的表面闪络特性有积极影响。但是,发生跳火时的大电流对XLPS的表面性能起破坏作用。据说在小闪络电流下,有限数量的重复脉冲闪络会去除样品表面上的污染物,水和气体。此外,由于发射点的去除,电极和样品表面的微突起,特别是在阴极三重结处,它在这些情况下表现出“调节”效果和闪络特性的稳定情况。但是,在高闪络电流(ȦB; 1 kA)下重复闪络会导致表面退化。这种现象归因于高闪络能量改变了样品表面状态,破坏了样品表面并在样品表面上形成了明显的碳​​化通道和区域。因此在这种情况下闪络变得不稳定。通过总结和分析实验结果,提出了闪络能量作为表征真空中重复脉冲闪络降解现象的主要因素。

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