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Effect of surface charge on flashover voltage for Cross-linked Polystyrene (XPS) insulator under nanosecond pulse voltage in vacuum

机译:真空中纳秒脉冲电压下表面电荷对交联聚苯乙烯(XPS)绝缘子闪络电压的影响

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The surface flashover voltage of the insulator in vacuum is much lower than that of both insulators and the vacuum gap in the same dimension. The critical factor that effects surface flashover voltage is the accumulation of surface charge which can severely restrict the performance of the vacuum devices. Owing to the excellent electrical properties and mechanical properties, Cross-linked Polystyrene (XPS) is applied more and more widely as insulator material in military and aerospace industry. In order to study the characteristics of surface charge and its effect on surface flashover voltage on the XPS insulator under nanosecond pulse voltage in vacuum, a set of insulator surface charge measurement system and surface flashover voltage test platform under nanosecond pulse in vacuum have been set up in this paper. This paper adopts the electrostatic capacitance probe method to acquire the distribution of surface charge on XPS insulator, studies the effect of amplitude and pulse number of voltage on the characteristics of surface charge accumulation, and analyzes the effect of surface charge on surface flashover voltage under nanosecond pulse voltage in vacuum. The experimental results indicate that, with the increase of voltage amplitude and pulse number, there is an obvious increase on the amount of surface charge accumulation. The accumulated charges on the surface have marked effect on surface flashover voltage, and the maximum amount of flashover voltage to decrease is 15.5%. Under the same conditions, the amount of surface charge accumulation of XPS insulator is much less than that of ceramic insulator.
机译:真空中绝缘子的表面闪络电压远低于两个绝缘子和相同尺寸的真空间隙的表面闪络电压。影响表面闪络电压的关键因素是表面电荷的积累,这会严重限制真空设备的性能。由于优异的电性能和机械性能,交联聚苯乙烯(XPS)越来越广泛地用作军事和航空航天工业的绝缘体材料。为了研究真空下纳秒脉冲电压下XPS绝缘子的表面电荷特性及其对表面闪络电压的影响,建立了一套真空下纳秒脉冲的绝缘子表面电荷测量系统和表面闪络电压测试平台。在本文中。本文采用静电电容探针法获取XPS绝缘子表面电荷的分布,研究电压幅值和脉冲数对表面电荷累积特性的影响,分析表面电荷对纳秒级表面闪络电压的影响。真空中的脉冲电压。实验结果表明,随着电压幅值和脉冲数的增加,表面电荷累积量明显增加。表面上累积的电荷对表面闪络电压有显着影响,并且最大降低的闪络电压量为15.5%。在相同条件下,XPS绝缘子的表面电荷积累量远小于陶瓷绝缘子。

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