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Study of silicon chip soldering in high-power transistor housing

机译:高功率晶体管壳体硅芯片焊接研究

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The aim of this work is to study the possibility of reducing the labor consumption and cost of high-power silicon transistor manufacturing without compromise in transistor low thermal resistance. To this end we experimentally explored replacing Au-Si solder with lead-silver solder or other solders for silicon chip soldering in transistor housings. This will reduce gold consumption and increase the efficiency of high-power transistor silicon chip installation due to the use of batch soldering technology. We also studied the effect of different silicon wafer back side treatment and thinning methods on the thermal resistance of the transistors. To improve the soldering quality we applied preliminary Ti–Ni metallization of the reverse side of the silicon wafer. We experimentally assessed the effect of outer housing layer materials and back side chip metallization. For lead-silver soldering of silicon chips, the best housing is that with a nickel outer layer rather than with a gold-plated one, because the resultant thermal resistance is lower and the absence of gold makes the technology cheaper. We obtained a 0.6K/W thermal resistance for a 24mm 2 chip area.
机译:这项工作的目的是研究降低高功率硅晶体管制造的劳动力消耗和成本的可能性,而不会在晶体管低热电阻中妥协。为此,我们通过在晶体管壳体中使用铅银焊料或其他焊料进行实验探索用铅银焊料或其他焊料替换Au-Si焊料。这将减少黄金消耗,并提高由于批料焊接技术的高功率晶体管硅芯片安装的效率。我们还研究了不同硅晶片背面处理和稀释方法对晶体管的热阻的影响。为了提高焊接质量,我们应用硅晶片反面的初步Ti-Ni金属化。我们通过实验评估了外壳层材料和背面芯片金属化的影响。对于硅芯片的铅银焊接,最好的外壳是用镍外层而不是用镀金的壳体,因为所得的热阻较低,没有金的缺失使得该技术更便宜。我们为24mm 2芯片区域获得了0.6k / w的热阻。

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