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首页> 外文期刊>Bulletin of materials science >Hydrostatic pressure effects on the processes of lattice thermal conductivity of bulk Silicon and nanowires
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Hydrostatic pressure effects on the processes of lattice thermal conductivity of bulk Silicon and nanowires

机译:对散装硅和纳米线的晶格导热率工艺的静水压效应

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摘要

The lattice thermal conductivity (LTC) of silicon nanowires (NWs) with diameters of 115, 56, 37 and 22 nm in the temperature range of 2–300 K for different pressures ranging from 0 to 10 GPa, was calculated by employing a modified Callaway model. Both longitudinal and transverse modes were explicitly considered within the model. A strategy is utilized to calculate the Debye and phonon group velocity in addition to the bulk modulus and it is derivative for different NW diameters from their related melting temperature under different pressures. The influence of the Gruneisen parameter, surface roughness and dislocation as structurally dependent parameters are successfully exploited to correlate the calculated values of LTC to that of the experimentally measured curves at various pressures including zero. The respective application of the Murnghan and Clapeyron equations for pressure-dependent lattice volume and melting temperature in the Callaway model produces results that tend to be systematically applicable by this model. The confinement and size effects of phonons and the role of pressure in the reduction of LTC are investigated. The peak value of LTC decreases with the increase of pressure for both bulk and its nanowires.
机译:通过采用改进的Callaway计算,在2-300k的温度范围内,直径为115,56,37和22nm的硅纳米线(nws)的晶纳米线(nws)的晶纳线(nws)的晶格导热率(nws)的温度范围为0至10gpa,模型。在模型中明确地考虑了纵向和横向模式。除了散装模量之外,利用策略来计算去脱模和声子组速度,并且在不同压力下与其相关熔化温度不同的NW直径的衍生物。 Gruneisen参数,表面粗糙度和位错的影响是成功利用的,以将LTC的计算值与包括零的各种压力的实验测量曲线的计算值相关联。 Murnghan和Clapyyron方程对Callaway模型中的压力依赖性晶格体积和熔化温度的各自应用产生了该模型系统地适用的结果。研究了声子的约束和大小效应和压力在LTC的减少中的作用。 LTC的峰值随着散装及其纳米线的压力的增加而降低。

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