首页> 外文期刊>Bulletin of the Korean Chemical Society >Non-monotonic Size Dependence of Electron Mobility in Indium Oxide Nanocrystals Thin Film Transistor
【24h】

Non-monotonic Size Dependence of Electron Mobility in Indium Oxide Nanocrystals Thin Film Transistor

机译:氧化铟纳米晶体薄膜晶体管中电子迁移率的非单调尺寸依赖性

获取原文
           

摘要

Indium oxide nanocrystals (In2O3 NCs) with sizes of 5.5 nm–10 nm were synthesized by hot injection of the mixture precursors, indium acetate and oleic acid, into alcohol solution (1-octadecanol and 1-octadecence mixture). Field emission transmission electron microscopy (FE-TEM), High resolution X-Ray diffraction (Xray), Nuclear magnetic resonance (NMR), and Fourier transform infrared spectroscopy (FT–IR) were employed to investigate the size, surface molecular structure, and crystallinity of the synthesized In2O3 NCs. When covered by oleic acid as a capping group, the In2O3 NCs had a high crystallinity with a cubic structure, demonstrating a narrow size distribution. A high mobility of 2.51 cm2/V·s and an on/off current ratio of about 1.0 × 103 were observed with an In2O3 NCs thin film transistor (TFT) device, where the channel layer of In2O3 NCs thin films were formed by a solution process of spin coating, cured at a relatively low temperature, 350 °C. A size-dependent, non-monotonic trend on electron mobility was distinctly observed: the electron mobility increased from 0.43 cm2/V·s for NCs with a 5.5 nm diameter to 2.51 cm2/V·s for NCs with a diameter of 7.1 nm, and then decreased for NCs larger than 7.1 nm. This phenomenon is clearly explained by the combination of a smaller number of hops, a decrease in charging energy, and a decrease in electronic coupling with the increasing NC size, where the crossover diameter is estimated to be 7.1 nm. The decrease in electronic coupling proved to be the decisive factor giving rise to the decrease in the mobility associated with increasing size in the larger NCs above the crossover diameter.
机译:通过将混合物前体醋酸铟和油酸热注射到乙醇溶液(1-十八烷醇和1-十八烷混合物)中,合成尺寸为5.5 nm–10 nm的氧化铟纳米晶体(In2O3 NCs)。场发射透射电子显微镜(FE-TEM),高分辨率X射线衍射(Xray),核磁共振(NMR)和傅立叶变换红外光谱(FT-IR)用于研究尺寸,表面分子结构和合成的In2O3 NC的结晶度。当用油酸作为封端基团覆盖时,In2O3 NCs具有高结晶度和立方结构,表明其尺寸分布较窄。使用In2O3 NCs薄膜晶体管(TFT)器件观察到2.51 cm2 / V·s的高迁移率和约1.0×103的开/关电流比,其中In2O3 NCs薄膜的沟道层是通过溶液形成的旋涂工艺,在相对较低的温度350°C下固化。明显观察到了电子迁移率的尺寸依赖性非单调趋势:电子迁移率从直径5.5 nm的NCs的0.43 cm2 / V·s增加到直径7.1 nm的NCs的2.51 cm2 / V·s,然后对于大于7.1 nm的NC减小。这种现象可以用跳数较少,充电能量减少以及电子耦合随NC尺寸增加而减少的现象清楚地解释,其中交叉直径估计为7.1 nm。电子耦合的减少被证明是决定性因素,该决定性因素引起了迁移率的降低,而迁移率的降低与交叉直径以上的较大NC中尺寸的增加有关。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号