首页> 外国专利> PDMS - - METHODS OF MANUFACTURING ALUMINIUM-INDIUM ZINC OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR USING PDMS PASSIVATINION LAYER AND ALUMINIUM-INDIUM ZINC OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR MANUFACTURED BY THE METHODS

PDMS - - METHODS OF MANUFACTURING ALUMINIUM-INDIUM ZINC OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR USING PDMS PASSIVATINION LAYER AND ALUMINIUM-INDIUM ZINC OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR MANUFACTURED BY THE METHODS

机译:PDMS--使用PDMS钝化层和铝铟锌氧化物半导体薄膜晶体管制造铝铟锌氧化物薄膜晶体管的方法

摘要

A method of manufacturing an aluminum-indium zinc oxide semiconductor thin film transistor is disclosed. In the aluminum-indium zinc oxide semiconductor thin film transistor, a gate electrode is formed on a substrate, and a gate insulating film is formed on the substrate to cover the gate electrode. A precursor solution in which a zinc precursor, an indium precursor, and an aluminum precursor are dissolved is coated on the gate insulating film to form a semiconductor active layer, and then a source electrode and a drain electrode are formed on the semiconductor active layer.
机译:公开了一种制造铝铟锌氧化物半导体薄膜晶体管的方法。在铝铟锌氧化物半导体薄膜晶体管中,栅电极形成在基板上,并且栅绝缘膜形成在基板上以覆盖栅电极。将溶解有锌前驱物,铟前驱物和铝前驱物的前驱物溶液涂覆在栅极绝缘膜上以形成半导体有源层,然后在半导体有源层上形成源电极和漏电极。

著录项

  • 公开/公告号KR101630028B1

    专利类型

  • 公开/公告日2016-06-13

    原文格式PDF

  • 申请/专利权人 부산대학교 산학협력단;

    申请/专利号KR20140025117

  • 发明设计人 이문석;박성민;

    申请日2014-03-03

  • 分类号H01L29/786;H01L21/316;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 14:12:25

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