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Computation of the Spectral Density of CurrentFluctuations in Bulk Silicon Based on the Solution of theBoltzmann Transport Equation

机译:基于Boltzmann输运方程解的体硅中电流波动谱密度的计算

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Numerical simulation results for the spectral density of noise due to current fluctuations arepresented. The mathematical framework is based on the interpretation of the equationsdescribing electron transport in the semiclassical transport model as stochastic differentialequations (SDE). Within this framework, it was previously shown that the autocovariancefunction of current fluctuations can be obtained from the transient solution of the Boltzmanntransport equation (BTE) with special initial conditions. The key aspect which differentiatesthis approach from other noise models is that this approach directly connects noise characteristicswith the physics of scattering in the semiclassical transport model and makes no additionalassumptions regarding the nature of noise. The solution of the BTE is based on theLegendre polynomial method. A numerical algorithm is presented for the solution of the transientBTE. Numerical results are in good agreement with Monte Carlo noise simulations forthe spectral density of current fluctuations in bulk silicon.
机译:给出了电流波动引起的噪声频谱密度的数值模拟结果。该数学框架基于对方程的解释,该方程将半经典输运模型中的电子输运描述为随机微分方程(SDE)。在此框架内,先前已证明可以从具有特殊初始条件的Boltzmann输运方程(BTE)的瞬态解获得电流波动的自协方差函数。将该方法与其他噪声模型区分开来的关键方面是,该方法将噪声特性与半经典传输模型中的散射物理特性直接联系在一起,并且没有对噪声的性质做任何附加假设。 BTE的解决方案基于Legendre多项式方法。提出了一种数值算法来解决transientBTE问题。数值结果与蒙特卡洛噪声仿真对于体硅中电流波动的频谱密度非常吻合。

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