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首页> 外文期刊>APL Materials >Topological Dirac semimetal Na3Bi films in the ultrathin limit via alternating layer molecular beam epitaxy
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Topological Dirac semimetal Na3Bi films in the ultrathin limit via alternating layer molecular beam epitaxy

机译:通过交替层分子束外延在超薄极限中的拓扑Dirac半金属Na3Bi膜。

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摘要

Ultrathin films of Na3Bi on insulating substrates are desired for opening a bulk bandgap and generating the quantum spin Hall effect from a topological Dirac semimetal, though continuous films in the few nanometer regime have been difficult to realize. Here, we utilize alternating layer molecular beam epitaxy to achieve uniform and continuous single-crystal films of Na3Bi(0001) on insulating Al2O3(0001) substrates and demonstrate electrical transport on films with 3.8 nm thickness (4 unit cells). The high material quality is confirmed through reflection high-energy electron diffraction, scanning tunneling microscopy, x-ray diffraction, and x-ray photoelectron spectroscopy.
机译:绝缘衬底上的Na3Bi超薄膜是理想的,用于打开体带隙并从拓扑狄拉克半金属产生量子自旋霍尔效应,尽管很难实现几纳米级的连续膜。在这里,我们利用交替层分子束外延技术在绝缘的Al2O3(0001)衬底上获得均匀且连续的Na3Bi(0001)单晶膜,并演示了在3.8 nm厚度的膜(4个晶胞)上的电传输。通过反射高能电子衍射,扫描隧道显微镜,X射线衍射和X射线光电子能谱确认了高材料质量。

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