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AIR-STABLE PASSIVATION OF TOPOLOGICAL DIRAC SEMIMETALS

机译:拓扑钝角半边形的空气稳定钝化

摘要

Described herein is a structure including: means for generating an electric field; a topological Dirac semimetal layer, wherein the topological Dirac semimetal layer is non- conductively separated from the means for generating the electric field, and the means for generating the electric field is configured to apply the electric field to at least a portion of the topological Dirac semimetal layer; and an oxygen barrier layer for preventing oxidation of the topological Dirac semimetal layer, the oxygen barrier layer formed of a material of the form MF2, wherein M is an alkaline earth metal. Also described herein is a structure for altering the charge carrier density in a topological Dirac semimetal, the structure comprising: a conductor; an insulating layer; a topological Dirac semimetal layer separated from the conductor by at least the insulating layer; an oxygen barrier layer for preventing oxidation of the topological Dirac semimetal layer, the oxygen barrier layer formed from a material of the form MF2, wherein M is an alkaline earth metal; and at least one electrode contacting the topological Dirac semimetal layer; wherein the conductor and the at least one electrode are configured to apply an electric field to at least a portion of the topological Dirac semimetal layer to alter the charge carrier density of the topological Dirac semimetal layer. Further described here is a structure for altering the band gap of a topological Dirac semimetal, the structure comprising: a conductor; an insulating layer; a topological Dirac semimetal layer separated from the conductor by at least the insulating layer; and an oxygen barrier layer for preventing oxidation of the topological Dirac semimetal layer, the oxygen barrier layer formed from a material of the form MF2, wherein M is an alkaline earth metal; wherein the conductor is configured to apply an electric field to at least a portion of the topological Dirac semimetal layer to alter the band gap of the topological Dirac semimetal layer. Still further described herein are related methods of forming a topological Dirac semimetal layer on a substrate.
机译:这里描述的结构包括:用于产生电场的装置;以及用于产生电场的装置。拓扑狄拉克半金属层,其中拓扑狄拉克半金属层与用于产生电场的装置非导电地分离,并且用于产生电场的装置被配置为将电场施加到拓扑狄拉克的至少一部分半金属层氧阻挡层由MF 2形式的材料形成,其中M是碱土金属,该氧阻挡层用于防止拓扑狄拉克半金属层氧化。本文还描述了一种用于改变拓扑狄拉克半金属中的电荷载流子密度的结构,该结构包括:导体;和绝缘层;拓扑狄拉克半金属层,至少通过绝缘层与导体隔开;用于防止拓扑狄拉克半金属层氧化的氧阻挡层,该氧阻挡层由MF2形式的材料形成,其中M是碱土金属;至少一个电极接触拓扑狄拉克半金属层;其中,导体和至少一个电极被配置为向拓扑狄拉克半金属层的至少一部分施加电场以改变拓扑狄拉克半金属层的电荷载流子密度。这里进一步描述了一种用于改变拓扑狄拉克半金属的带隙的结构,该结构包括:导体;绝缘层;拓扑狄拉克半金属层,至少通过绝缘层与导体隔开;所述氧阻挡层由MF 2形式的材料形成,其中M为碱土金属;所述氧阻挡层用于防止拓扑狄拉克半金属层氧化。其中,导体被配置为向拓扑狄拉克半金属层的至少一部分施加电场以改变拓扑狄拉克半金属层的带隙。本文还进一步描述了在衬底上形成拓扑狄拉克半金属层的相关方法。

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