Core-Based Testing of Embedded Mixed-Signal Modules in a SoC

摘要

This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial products. Two SoC examples emphasize its benefits and performance.