Physically-Aware Analysis of Systematic Defects in Integrated Circuits

Tam W. C.; Blanton R. D.

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Physically-Aware Analysis of Systematic Defects in Integrated Circuits

机译：集成电路中系统缺陷的物理感知分析

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来源
《Design & Test of Computers, IEEE》 |2012年第5期|p.81-93|共13页
作者
Tam W. C.; Blanton R. D.;
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作者单位

Nvidia Corporation, Santa Clara,;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类
关键词
Feature extraction; Integrated circuit modeling; Layout; Radar; Systematics; Testing; DFM rule evaluation; Systematic defects; layout analysis; volume diagnosis; yield learning;

机译：特征提取;集成电路建模;布局;雷达;系统学测试;DFM规则评估;系统性缺陷;布局分析;体积诊断;产生学习;

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Physically-Aware Analysis of Systematic Defects in Integrated Circuits

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