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PHYSICALLY-AWARE ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED CIRCUITS

机译：集成电路中系统缺陷的物理感知分析

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Chiu Tam; Wing Chiu Tam;
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年度 2013
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1. Physically-Aware Analysis of Systematic Defects in Integrated Circuits [J] . Tam W. C., Blanton R. D. Design & Test of Computers, IEEE . 2012,第5期

机译：集成电路中系统缺陷的物理感知分析
2. Systematic Approaches for Analysis and Design of Terahertz and Millimeter-Wave Integrated Circuits Using Carbon Nanotube FETs [J] . Siavash Moghadami, Farzaneh JalaliBidgoli, Shahab Ardalan Canadian journal of electrical and computer engineering . 2016,第2期

机译：使用碳纳米管FET进行太赫兹和毫米波集成电路分析和设计的系统方法
3. Systematic Analysis and Modeling of On-Chip Spiral Inductors for Complementary Metal Oxide Semiconductor Radio Frequency Integrated Circuits Applications [J] . Mao-Chyuan Tang, Yean-Kuen Fang, Wen-Kuan Yeh, Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers . 2006,第4B期

机译：互补金属氧化物半导体射频集成电路应用中片上螺旋电感器的系统分析和建模
4. Physically-aware analysis of systematic defects in integrated circuits [C] . Tam Wing Chiu, Blanton R. D. (Shawn) 2011 IEEE International Test Conference . 2011

机译：对集成电路中系统缺陷的物理感知分析
5. Physically-aware analysis of systematic defects in integrated circuits. [D] . Tam, Wing Chiu. 2012

机译：对集成电路中系统缺陷的物理感知分析。
6. Graph-Based Symbolic Technique and Its Application in the Frequency Response Bound Analysis of Analog Integrated Circuits [O] . E. Tlelo-Cuautle, S. Rodriguez-Chavez, A. A. Palma-Rodriguez -1

机译：基于图的符号技术及其在模拟集成电路频率响应界分析中的应用
7. Defect and yield analysis of semiconductor components and integrated circuits [O] . Karilahti Mika 2003

机译：半导体元件和集成电路的缺陷和良率分析
8. Defect and Yield Analysis of Semiconductor Components and Integrated Circuits [R] . Karilahti, M. 2003

机译：半导体元件和集成电路的缺陷及良率分析

PHYSICALLY-AWARE ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED CIRCUITS

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