-Based Generation of Partially-Functional Broadside Tests

摘要

This paper describes a procedure that computes seeds for -based generation of partially-functional broadside tests. Existing -based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed in order to reduce the Hamming distance between the scan-in state that creates and a reachable state . When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault co- erage.