Thermal Investigation of High Power Optical Devices by Transient Testing

摘要

In case of opto-electronic devices, the power applied on the device leaves in a parallel heat and light transport, the interpretation of R{sub}(th) is not obvious. The paper shows results of a combined optical and thermal measurement for the characterization of power light emitting diodes (LEDs). A model explaining R{sub}(th) changes at different current levels is proposed.