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Modeling and Analysis of On-Chip Single and H-tree Distributed RLC Interconnects

机译:片上单树和H树分布式RLC互连的建模和分析

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This paper presents novel methods for modeling and analysis of on-chip Single and H-tree distributed resistance inductance capacitance interconnects. The matrix pade-type approximation and scaling and squaring methods are employed for the numerical estimation of delay in single interconnect, and H-tree interconnects. The proposed models, which are based on these methods, provide rational function approximation for obtaining a passive interconnect model. Multiple single input single output model approximated transfer functions are developed for H-tree interconnects structure. With the equivalent reduced order lossy interconnect transfer functions, finite ramp responses are obtained, and line delay is estimated for various line lengths, input ramp rise times, source resistances, parasitic capacitances and load capacitances. In order to demonstrate the accuracy of proposed models, the estimated 50 % delay values are compared with the standard HSPICE W-element model and are found to be in good agreement. The proposed models worst case 50 % delay errors of single interconnect are 0.27 and 0.24 % respectively, while the worst case 50 % delay errors of H-tree structure are 5.73 and 3.94 % respectively.
机译:本文提出了用于建模和分析片上单和H树分布电阻电感电容互连的新颖方法。矩阵pade型逼近,缩放和平方方法用于对单个互连和H树互连中的延迟进行数值估计。基于这些方法的拟议模型为获得无源互连模型提供了有理函数逼近。针对H树互连结构开发了多个单输入单输出模型近似传递函数。利用等效的降阶有损互连传递函数,可以获得有限的斜坡响应,并且可以估算各种线路长度,输入斜坡上升时间,源电阻,寄生电容和负载电容的线路延迟。为了证明所提出模型的准确性,将估计的50%延迟值与标准HSPICE W元素模型进行了比较,发现它们具有很好的一致性。所提出的模型的单个互连的最坏情况下50%的延迟误差分别为0.27%和0.24%,而H型树结构的最坏情况下50%的延迟误差分别为5.73%和3.94%。

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