CYCLOGEN: automatic, functional-level test generator based on thecyclomatic complexity measure and on the ROBDD representation

摘要

In this paper we have laid the foundations for a functional testngeneration procedure based on a cyclomatic complexity measure (CCM) andnon the reduced, ordered binary decision diagram representation (ROBDD)nfor Boolean function manipulation. The CCM has been defined fornsingle-output and multioutput electronic circuits. This measure computesnthe number of BDD paths to be transformed into test vectors. This newntest generation approach, called CYCLOGEN, has been implemented, and thentests for several functional primitives, as well as the ISCAS-85nbenchmark circuits, have been generated successfully. The results shownthat this approach is effective and promising