The authors have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for one-output and multi-output electronic circuits predicting a minimal number of test vectors. This new test generation approach, called Cyclogen, has been implemented, and the tests for several functional primitives as well as for the ISCAS-85 benchmark circuits have been generated successfully. The results show that this approach is effective and promising.
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