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A Hybrid PLL Using Low-Power GRO-TDC for Reduced In-Band Phase Noise

机译:使用低功率GRO-TDC的混合PLL,可降低带内相位噪声

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In this brief, we propose a hybrid phase locked loop (PLL) which employs a coarse resolution gated ring oscillator time-to-digital converter in the digital integral (I) path and a switched RC circuit in the analog proportional (P) path, which provide lower in-band noise than a bang-bang phase detector-based hybrid PLL (BB-HPLL). We also present noise analysis of the proposed PLL which shows that in-band noise can he further reduced by increasing the integral path gain, which is contrary to conventional design of BB-HPLLs where I path gain is minimized A prototype chip fabricated in the 65-nm CMOS achieves 13-dB improvement of in-band phase noise compared to a conventional hybrid PLL and 2.08 ps(rms) jitter at 4.8 GHz, while consuming 2.22 mW from a 1.0-V supply.
机译:在本简介中,我们提出了一种混合锁相环(PLL),该锁相环在数字积分(I)路径中采用了粗分辨率门控环形振荡器时间数字转换器,在模拟比例(P)路径中采用了开关RC电路,与基于Bang-bang相位检测器的混合PLL(BB-HPLL)相比,它们具有更低的带内噪声。我们还对建议的PLL进行了噪声分析,结果表明,通过增加积分路径增益可以进一步降低带内噪声,这与BB-HPLL的常规设计(I路径增益最小)相反,该原型芯片采用65与传统的混合PLL相比,n-nm CMOS可实现13dB的带内相位噪声改善,并在4.8 GHz频率下具有2.08 ps(rms)的抖动,同时从1.0V的电源消耗2.22 mW的功率。

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