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Copper electroplating technology for microvia filling

机译:微孔填充的铜电镀技术

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This paper describes a copper electroplating enabling technology for filling microvias. Driven by the need for faster, smaller and higher performance communication and electronic devices, sequential build up (SBU) technology has been adopted as a viable multilayer printed circuit manufacturing technology. Increased wiring density, reduced line widths, smaller through-holes and microvias are all attributes of these high density interconnect (HDI) packages. Filling the microvias with conductive material allows the use of stacked vias and via in pad designs. Other potential design attributes include thermal management enhancement and benefits for high frequency circuitry. Electrodeposited copper can be utilized for filling microvias and provides potential advantages over alternative via plugging techniques. The features, development, scale up and results of direct current (DC) and periodic pulse reverse (PPR) acid copper via filling processes, including chemistry and equipment, are described.
机译:本文介绍了一种用于填充微孔的电镀铜的技术。在对更快,更小,更高性能的通信和电子设备的需求推动下,顺序构建(SBU)技术已被用作可行的多层印刷电路制造技术。这些高密度互连(HDI)封装具有增加的布线密度,减小的线宽,较小的通孔和微孔等所有特性。用导电材料填充微孔可以使用堆叠的过孔和焊盘设计中的过孔。其他潜在的设计属性包括增强的热管理功能以及对高频电路的好处。电沉积的铜可用于填充微孔,并提供了优于其他通孔堵塞技术的潜在优势。描述了通过填充工艺(包括化学和设备)的直流(DC)和周期性脉冲反向(PPR)酸性铜的特性,开发,放大和结果。

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