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Copper Electroplating Technology for Microvia Filling

机译:微孔填充的铜电镀技术

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This paper describes a copper electroplating enabling technology for filling microvias.rnDriven by the need for faster, smaller and higher performance communication and electronic devices, build-up technologyrnincorporating microvias has emerged as a viable multilayer printed circuit manufacturing technology. Increased wiringrndensity, reduced line widths, smaller through-holes and microvias are all attributes of these High Density Interconnect (HDI)rnpackages.rnFilling the microvias with conductive material allows the use of stacked vias and via in pad designs thereby facilitatingrnadditional packaging density. Other potential design attributes include thermal management enhancement and benefits forrnhigh frequency circuitry. Electrodeposited copper can be utilized for filling microvias and provides potential advantages overrnalternative via plugging techniques.rnThe features, development, scale up and results of direct current (DC) and periodic pulse reverse (PPR) acid copper via fillingrnprocesses, including chemistry and equipment, are described.
机译:本文介绍了一种用于填充微孔的铜电镀使能技术。在对更快,更小,更高性能的通信和电子设备的需求推动下,结合微孔的堆积技术已成为一种可行的多层印刷电路制造技术。这些高密度互连(HDI)封装均具有增加的布线密度,减小的线宽,更小的通孔和微导通孔。用导电材料填充微导通孔可以在堆叠的过孔和焊盘设计中使用,从而有利于增加额外的封装密度。其他潜在的设计属性包括增强的热管理功能和对高频电路的好处。电沉积铜可用于填充微通孔,并通过堵塞技术比其他方法具有潜在的优势。通过填充工艺(包括化学和设备),直流(DC)和周期性脉冲反向(PPR)酸性铜的特性,开发,放大和结果如下:描述。

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