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Tradeoff between speed and static power dissipation of ultra-thin body SOI MOSFETs

机译:超薄体SOI MOSFET的速度与静态功耗之间的权衡

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摘要

The speed performance and static power dissipation of the ultra-thin-body (UTB) MOSFETs have been comprehensively investigated, with both DC and AC behaviours considered. Source/drain extension width (L_(sp)) and silicon film thickness (t_(si)) are two independent parameters that influence the speed and static power dissipation of UTB silicon-on-insulator (SOI) MOSFETs respectively, which can result in great design flexibility. Based on the different effects of physical and geometric parameters on device characteristics, a method to alleviate the contradiction between power dissipated and speed of UTB SOI MOSFETs is proposed. The optimal design regions of t_(si) and L_(sp) for low operating power and high performance logic applications are given, which may shed light on the design of UTB SOI MOSFETs.
机译:对超薄型(UTB)MOSFET的速度性能和静态功耗进行了全面研究,同时考虑了直流和交流行为。源极/漏极扩展宽度(L_(sp))和硅膜厚度(t_(si))是两个独立的参数,分别影响UTB绝缘体上硅(SOI)MOSFET的速度和静态功耗,这可能会导致极大的设计灵活性。针对物理和几何参数对器件特性的不同影响,提出了一种缓解UTB SOI MOSFET的功耗与速度之间矛盾的方法。给出了针对低工作功率和高性能逻辑应用的t_(si)和L_(sp)的最佳设计区域,这可能有助于UTB SOI MOSFET的设计。

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