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Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

机译:通过基于原子力显微镜的方法探索有机和聚合物功能材料的纳米级电和电子特性

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摘要

Beyond imaging, atomic force microscopy (AFM) based methodologies enable the quantitative investigation of a variety of physico-chemical properties of (multicomponent) materials with a spatial resolution of a few nanometers. This Feature Article is focused on two AFM modes, i.e. conducting and Kelvin probe force microscopies, which allow the study of electrical and electronic properties of organic thin films, respectively. These nanotools provide a wealth of information on (dynamic) characteristics of tailor-made functional architectures, opening pathways towards their technological application in electronics, catalysis and medicine.
机译:除了成像之外,基于原子力显微镜(AFM)的方法还可以对空间分辨率为几纳米的(多组分)材料的各种物理化学性质进行定量研究。这篇专题文章重点介绍了两种AFM模式,即传导和开尔文探针力显微技术,分别允许研究有机薄膜的电学和电子性能。这些纳米工具提供了有关量身定制的功能架构的(动态)特性的大量信息,为它们在电子,催化和医学领域的技术应用打开了途径。

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