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Nanoscale characterization of squaraine-fullerene-based photovoltaic active layers by atomic force microscopy mechanical and electrical property mapping

机译：基于Squaraine-富勒烯的光伏活性层的纳米级表征通过原子力显微镜机电映射

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Tonya Coffey; Andrew Seredinski; Jake N. Poler; Crystal Patteson; William H. Watts; Kenny Baptiste; Chenyu Zheng; Jeremy Cody; Christopher J. Collison;
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1. Nanoscale characterization of squaraine-fullerene-based photovoltaic active layers by atomic force microscopy mechanical and electrical property mapping [J] . Coffey Tonya, Seredinski Andrew, Poler Jake N., Thin Solid Films . 2019,第JANa1期

机译：基于原子力显微镜的机械和电性能图，对基于方酸-富勒烯的光伏活性层进行纳米表征
2. Quantitative Nanoscale Mapping with Temperature Dependence of the Mechanical and Electrical Properties of Poly(3-hexylthiophene) by Conductive Atomic Force Microscopy [J] . Wood Dawn, Hancox Ian, Jones Tim S., The journal of physical chemistry, C. Nanomaterials and interfaces . 2015,第21期

机译：导电原子力显微镜对温度影响聚（3-己基噻吩）的机械和电学性质的定量纳米级映射
3. Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy [J] . Olivier Douheret, Laurence Lutsen, Ann Swinnen, Applied Physics Letters . 2006,第3期

机译：导电原子力显微镜对有机光伏混合物的纳米电学表征
4. NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy [C] . S. C. Minne, Y. Hu, S. Hu, . 2010

机译：使用峰力分接原子力显微镜的纳米级定量力学性能映射。
5. Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy. [D] . Rupasinghe, R-A-Thilini Perera. 2015

机译：使用原子力显微镜探测纳米级材料的电气和机械性能。
6. Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy [O] . Zahra Abooalizadeh, Leszek Josef Sudak, Philip Egberts 2019

机译：通过动态原子力显微镜对机械性能进行纳米尺度空间映射
7. Quantitative nanoscale mapping with temperature dependence of the mechanical and electrical properties of poly(3-hexylthiophene) by conductive atomic force microscopy [O] . Wood, Dawn, Hancox, Ian, Jones, T. S. (Tim S.), 2015

机译：导电原子力显微镜对纳米级聚（3-己基噻吩）的机械和电学性质与温度的关系进行定量的纳米级标测

Nanoscale characterization of squaraine-fullerene-based photovoltaic active layers by atomic force microscopy mechanical and electrical property mapping

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