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Growth of Zn_(1-x)Mn_xTe films on GaAs(1 0 0) by hot-wall epitaxy

机译:热壁外延在GaAs(1 0 0)上生长Zn_(1-x)Mn_xTe薄膜

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We have studied the growth of the Zn_(1-x)Mn_x/Te film on the GaAs(1 0 0) substrate by use of hot-wall epitaxy (HWE) system. The growth rate is rather slow and the epitaxial Zn_(1-x)Mn_xTe films with thickness of about 230 nm are obtained after 6h deposition. Mn composition can be easily controlled in the range of x = 0―0.33 by changing the Mn source temperature (650-680℃). It, however, is found that the structural quality of the films degrades with increasing Mn composition. Obtained Zn_(1-x)Mn_xTe films showed photoluminescence originating in Mn~(2+) ions.
机译:我们已经研究了使用热壁外延(HWE)系统在GaAs(1 0 0)衬底上生长Zn_(1-x)Mn_x / Te膜。生长速度相当慢,并且在沉积6h后获得了厚度约为230 nm的外延Zn_(1-x)Mn_xTe薄膜。通过改变Mn源温度(650-680℃),可以容易地将Mn的组成控制在x = 0〜0.33的范围内。然而,发现膜的结构质量随着Mn组成的增加而降低。获得的Zn_(1-x)Mn_xTe薄膜显示出源自Mn〜(2+)离子的光致发光。

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