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TiAgx thin films for lower limb prosthesis pressure sensors: Effect of composition and structural changes on the electrical and thermal response of the films

机译:用于下肢假体压力传感器的TiAgx薄膜:成分和结构变化对薄膜电和热响应的影响

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摘要

Titanium-silver, Ti-Ag, thin films display excellent biocompatibility and reveal great potential to be used as conductive materials for prosthesis pressure sensors. In the frame of this work, TiAg_x thin films were deposited onto silicon and glass substrates by DC magnetron sputtering, using a pure Ti target containing different amounts of Ag pellets. The films display Ag/Ti ratios varying from 0 up to 0.36, resulting in relatively large range of composition, which gave rise to varied morphological, structural and some selected property responses. For Ag/Ti ratios below 3.0 × 10~(-3), the TiAg_x films exhibited similar behavior to those of standard Ti films. Above this critical value, the role of Ag becomes crucial on the crystallographic structure evolution, as well as on the surface morphology changes of the films. A gradual increase of the Ag/Ti ratio leads to the growth of Ti-Ag crystalline phases, whereas the long range order of Ti grains was reduced from 22 nm down to 7 nm. Similarly, a denser microstructure was developed with a reduction of the sharpness of the surface morphology. This critical Ag/Ti ratio (<3.0 × 10~(-3)) also corresponded to an enhanced electrical resistivity, which reached a value of ρ_(300k) = 72 μΩcm. The thermal characterization revealed a similar trend, with the existence of two clear distinct zones, related again with the different critical composition ratios and the correspondent changes in both morphology and structural features.
机译:钛-银,钛-银薄膜具有出色的生物相容性,并显示出巨大的潜力,可将其用作假体压力传感器的导电材料。在这项工作的框架中,使用包含不同量的Ag球粒的纯Ti靶,通过DC磁控溅射将TiAg_x薄膜沉积在硅和玻璃基板上。薄膜显示的Ag / Ti比值从0到0.36不等,导致组成范围相对较大,从而引起了不同的形态,结构和某些选定的特性响应。当Ag / Ti比值低于3.0×10〜(-3)时,TiAg_x膜表现出与标准Ti膜相似的行为。高于该临界值,Ag的作用对于晶体结构的演变以及薄膜的表面形态变化至关重要。 Ag / Ti比的逐渐增加导致Ti-Ag晶相的生长,而Ti晶粒的长程有序从22 nm减小到7 nm。类似地,开发了致密的微观结构,同时降低了表面形态的清晰度。临界的Ag / Ti比(<3.0×10〜(-3))也对应于电阻率的提高,达到ρ_(300k)= 72μΩcm。热表征显示出相似的趋势,存在两个明显的不同区域,再次与不同的临界组成比以及形态和结构特征的相应变化有关。

著录项

  • 来源
    《Applied Surface Science》 |2013年第15期|10-18|共9页
  • 作者单位

    Centra de Fisica, Universidade do Minho, 4710-057 Braga, Portugal;

    Centra de Fisica, Universidade do Minho, 4710-057 Braga, Portugal;

    Centra de Fisica, Universidade do Minho, 4710-057 Braga, Portugal,Universidade do Porto, Faculdade de Engenharia, Departamento de Engenharia Metalurgica e de Materials, Rua Roberto Frias, s, 4200-465 Porto, Portugal,SEC-CEMUC - Departamento de Engenharia Mecanica, Universidade de Coimbra, 3030-788 Coimbra, Portugal;

    Centra de Fisica, Universidade do Minho, 4710-057 Braga, Portugal;

    Mssociacao Euratom/IST, Instituto de Plasmas e Fusao Nuclear, Instituto Superior Tecnico, Universidade Tecnica de Lisboa, Av. Rovisco Pais, 1049-001 Lisboa, Portugal;

    Campus Tecnologico e Nuclear, Instituto Superior Tecnico, Universidade Tecnica de Lisboa, E.N. 10, 2686-953 Sacavem, Portugal;

    Institut FEMTO-ST, UMR 6174, Universite de Franche-Comte, CNRS, ENSMM, UTBM, 32 Avenue de l'observatoire, 25044 Besancon Cedex, France;

    Universidade do Porto, Faculdade de Engenharia, Departamento de Engenharia Metalurgica e de Materials, Rua Roberto Frias, s, 4200-465 Porto, Portugal,SEC-CEMUC - Departamento de Engenharia Mecanica, Universidade de Coimbra, 3030-788 Coimbra, Portugal;

    Centra de Fisica, Universidade do Minho, 4710-057 Braga, Portugal;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Pressure sensors; TiAg films; XRD; Electrical resistivity; Thermal conductivity;

    机译:压力传感器TiAg薄膜;XRD;电阻率;导热系数;

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