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XPS-nanocharacterization of organic layers electrochemically grafted on the surface of SnO2 thin films to produce a new hybrid material coating

机译:XPS-纳米表征通过化学接枝在SnO2薄膜表面上的有机层以产生新的杂化材料涂层

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This work presents the synthesis and the characterization of hybrid material thin films obtained by the combination of two processes. The electrochemical grafting of organic layers made of carboxyphenyl moieties is carried out from the reduction of a diazonium salt on tin dioxide (SnO2) thin films previously deposited on Si substrates by metal organic chemical vapor deposition (MOCVD). Since the MOCVD experimental parameters impact the crystal growth of the SnO2 layer (i.e. its morphology and its texturation), various electrochemical grafting models can occur, producing different hybrid materials. In order to evidence the efficiency of the electrochemical grafting of the carboxyphenyl moieties, X-ray Photoelectron Spectroscopy (XPS) is used to characterize the first nanometers in depth of the synthesized hybrid material layer. Then three electrochemical grafting models are proposed. (C) 2016 Elsevier B.V. All rights reserved.
机译:这项工作介绍了通过两种方法的组合获得的杂化材料薄膜的合成和表征。通过还原预先通过金属有机化学气相沉积(MOCVD)沉积在Si基板上的二氧化锡(SnO2)薄膜上的重氮盐,可以对羧基苯基部分的有机层进行电化学接枝。由于MOCVD实验参数会影响SnO2层的晶体生长(即其形态和织构化),因此会出现各种电化学接枝模型,从而产生不同的杂化材料。为了证明羧苯基部分的电化学接枝效率,使用X射线光电子能谱(XPS)表征了合成杂化材料层深度的第一个纳米。然后提出了三种电化学接枝模型。 (C)2016 Elsevier B.V.保留所有权利。

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