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Effects of non-spherical colloidal silica slurry on Al-NiP hard disk substrate CMP application

机译:非球形胶体二氧化硅浆料对Al-NiP硬盘基板CMP应用的影响

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Spherical and non-spherical colloidal silica size and shape were characterized and its effects on aluminum alloy nickel plated (Al-NiP) hard disk substrate during chemical mechanical polishing (CMP) was investigated. Non-spherical colloidal silica slurry shows significantly higher material removal rate (MRR) with higher coefficient of friction (CoF) when compared to spherical colloidal silica of similar size. CMP evaluations on non-spherical colloidal silica slurry particle size distribution (PSD) reveal that MRR can be further increased by using wider PSD. Conventional slurry for Al-NiP hard disk substrates which use alumina-silica composite slurry induces embedded alumina thermal asperities (TA) defects which can cause reliability failure at product level. CMP comparison between conventional alumina-silica slurry and non-spherical colloidal silica slurry shows substrates polished by using non-spherical colloidal silica slurry have no embedded TA defects, lower surface roughness and lower surface defects. (C) 2015 Elsevier B.V. All rights reserved.
机译:表征了球形和非球形胶体二氧化硅的尺寸和形状,并研究了其在化学机械抛光(CMP)过程中对铝合金镀镍(Al-NiP)硬盘基板的影响。与类似尺寸的球形胶体二氧化硅相比,非球形胶体二氧化硅浆料显示出明显更高的材料去除率(MRR)和更高的摩擦系数(CoF)。 CMP对非球形胶体二氧化硅浆料粒度分布(PSD)的评估表明,使用更宽的PSD可以进一步提高MRR。使用氧化铝-二氧化硅复合浆料的用于Al-NiP硬盘基板的常规浆料会引起嵌入的氧化铝热粗糙(TA)缺陷,从而可能导致产品级别的可靠性下降。常规氧化铝-二氧化硅浆料和非球形胶态二氧化硅浆料的CMP比较显示,通过使用非球形胶态二氧化硅浆料抛光的基材没有嵌入的TA缺陷,较低的表面粗糙度和较低的表面缺陷。 (C)2015 Elsevier B.V.保留所有权利。

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