Multilayer Y-Ba-Cu-O structures using ion-assisted intermediate layers

摘要

Multilayer thin films of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) were deposited in situ on yttria-stabilized zirconia (YSZ) and CeO/sub 2/ intermediate layers grown using ion-assisted pulsed-laser deposition. These structures were grown on amorphous SiO/sub 2/ dielectric layers. A critical current density of 3/spl times/10/sup 5/ A/cm/sup 2/ was obtained for a YBCO film grown on SiO/sub 2/-coated Haynes Alloy 230 substrate. Improvement of the critical current density was obtained below 77 K by doping the YBCO with 10% Ag. Angular magnetoresistance measurements provide further information about the texture of this film.