Multilayer Y-Ba-Cu-O structures using ion-assisted intermediate layers

摘要

Multilayer thin films of YBa2Cu3O7-δ (YBCO) were deposited in situ on yttria-stabilized zirconia (YSZ) and CeO2 intermediate layers grown using ion-assisted pulsed-laser deposition. These structures were grown on amorphous SiO2 dielectric layers. A critical current density of 3×105 A/cm2 was obtained for a YBCO film grown on SiO2-coated Haynes Alloy 230 substrate. Improvement of the critical current density was obtained below 77 K by doping the YBCO with 10% Ag. Angular magnetoresistance measurements provide further information about the texture of this film.