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USA interlaboratory comparison of superconductor simulator critical current measurements

机译:美国超导体模拟器临界电流测量的实验室间比较

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An interlaboratory comparison of critical current (I/sub c/) measurements was conducted on the superconductor simulator, which is an electronic circuit that emulates the extremely nonlinear voltage-current characteristic of a superconductor. These simulators are high precision instruments, and are useful for establishing the integrity of part of a superconductor measurement system. This study includes measurements from participating US laboratories, with NIST as the central, organizing laboratory. This effort was designed to determine the sources of uncertainty in I/sub c/ measurements due to uncertainties in the measurement apparatus, technique, or the analysis system. The participating laboratories measured the superconductor simulator with a variety of methods including DC and pulse. This comparison indicated the presence of systematic biases and higher variability at low voltages in the I/sub c/ determinations of the measurement systems. All critical current measurements at a criterion of 10 /spl mu/V on the I/sub c/ simulator were within 2% of the NIST value for nominal critical currents of 2 and 50 A. These results could significantly benefit superconductor measurement applications that require high-precision quality assurance.
机译:在超导体模拟器上进行了临界电流(I / sub c /)测量的实验室间比较,该模拟器是一种电子电路,可模拟超导体的极非线性电压-电流特性。这些模拟器是高精度仪器,可用于建立超导体测量系统的一部分的完整性。这项研究包括以NIST为中心,组织实验室的美国参与实验室的测量结果。这项工作旨在确定由于测量设备,技术或分析系统中的不确定性而导致的I / sub c /测量不确定性的来源。参与的实验室使用包括直流电和脉冲在内的多种方法对超导体模拟器进行了测量。该比较表明,在测量系统的I / sub c /确定中,在低电压下存在系统偏差和较高的可变性。对于2和50 A的额定临界电流,在I / sub c /模拟器上以10 / spl mu / V的标准进行的所有临界电流测量值均在NIST值的2%之内。这些结果可能会大大有利于需要进行超导测量的应用高精度的质量保证。

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