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Interlaboratory Comparison on High-Temperature Superconductor Critical-Current Measurements

机译:高温超导体临界电流测量的实验室间比较

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摘要

An extensive interlaboratory comparison was conducted on high temperature superconductor (HTS) critical-current measurements. This study was part of an international cooperative effort through the Versailles Project on Advanced Materials and Standards (VAMAS). The study involved six U.S. laboratories that are recognized leaders in the field of HTS. This paper includes the complete results from this comparison of critical-current measurements on Ag-sheathed Bi2Sr2Ca2Cu3O10–x (2223) tapes. The effects of sample characteristics, specimen mounting, measurement technique, and specimen damage were studied. The future development of a standard HTS measurement method is also discussed. Most of the evolution of this emerging technology has occurred in improvement of the performance of the conductors. The successful completion of this interlaboratory comparison is an important milestone in the evolution of HTS technology and marks a level of maturity that the technology has reached.
机译:在高温超导体(HTS)临界电流测量中进行了广泛的实验室间比较。这项研究是通过凡尔赛先进材料和标准项目(VAMAS)进行的国际合作努力的一部分。该研究涉及六个美国实验室,这些实验室是HTS领域公认的领导者。本文包括从对Ag护套Bi2Sr2Ca2Cu3O10–x(2223)磁带进行的临界电流测量的比较得出的完整结果。研究了样品特性,样品安装,测量技术和样品损坏的影响。还讨论了标准HTS测量方法的未来发展。这项新兴技术的大部分发展都发生在导体性能的提高上。实验室间比较的成功完成是HTS技术发展的重要里程碑,标志着该技术已达到一定的成熟度。

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