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Impact of a normally conducting surface layer on attenuation inhigh-Tc superconducting microstrip transmission lines

机译:正常导电表面层对高Tc超导微带传输线衰减的影响

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A two-dimensional (2-D) model is adopted to characterize high-T c superconducting (HTS) microstrip transmission lines with a normally conducting surface layer. The model is verified by comparison with a full-wave analysis calculation for identical all-superconducting lines and by calculation of the current distribution and propagation properties for a normal conductor version of the microstrip. Estimates are obtained for the transmission line attenuation constant versus thickness and conductivity of the resistive surface layer. The results suggest that in situ deposition of a normal metal overlayer on the HTS film surface may be a viable technique to secure the long-term performance of microwave devices
机译:采用二维(2-D)模型来表征具有正常导电表面层的高Tc超导(HTS)微带传输线。通过与用于相同的全超导线的全波分析计算进行比较,并通过计算微带的普通导体形式的电流分布和传播特性,来验证该模型。获得传输线衰减常数相对于电阻表面层的厚度和电导率的估计值。结果表明,在HTS膜表面上原位沉积常规金属覆盖层可能是确保微波设备长期性能的可行技术。

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