Growth of Biaxially Oriented Conductive ITO Buffer Layers on Textured Ni Tapes for YBCO Coated Conductors

摘要

We investigated the effect of the ${rm Ar}^{+}$ ion beam irradiation on removing NiO on the ${100}langle 001rangle$ textured Ni tape surface, and the validity of the ITO as a conductive buffer layer. Excellent biaxial crystal orientations of the ${rm CeO}_{2}$, YSZ and YBCO were achieved in the ${rm YBCO/YSZ/CeO}_{2}$ prepared on the ${100}langle 001rangle$ textured Ni tape, by irradiating the surface of the Ni tape before starting the deposition. The $J_{rm c}$ of the ${rm YBCO/YSZ/CeO}_{2}/{rm Ni}$ tape exceeded 2 ${rm MA/cm}^{2}$ at 77 K.