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Substrate-independent sulfur-activated dielectric and barrier-layer surfaces to promote the chemisorption of highly polarizable metallorganics

机译:独立于基质的硫活化介电层和势垒层表面,可促进高度极化的金属有机物的化学吸附

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A novel plasma-based process has been invented in which sulfur is used to enhance the chemisorption of highly po-larizable metallorganics to dielectric or barrier-layer surfaces. Three fundamentally different substrates were investigated: metal oxides (air-exposed Ta and SiO_2), a hybrid dielectric (Trikon) and a polymeric material (SiLK). All the surfaces could be modified with relative ease, resulting in a substrate-independent process. Further, palladium (Ⅱ) hexafluoroacetyl-acetonate was dosed on the substrates under study at sublimation and substrate temperatures of 34.8 ℃ and 175 ℃. Results show that increased rf power and decreased system pressure during sulfur deposition result in a larger relative percent reduced sulfur, at for example, the SiO_2 surface. In turn, this results in more palladium chemisorbed to the surface from a larger Pd 3d/Si 2p ratio. Rutherford backscattering spectrom-etry was used to estimate a sulfur areal density of approximately 1 x 10~(15) atoms/cm~2 on air-exposed Ta, when sulfur was deposited via H_2S and He in the range of 300 W to 700 W rf power at 60 mTorr. It was shown that the sulfur-activated surfaces are stable under ambient conditions. Also, after the sulfur-activated SiO_2 surface was dosed with Pd~Ⅱ(hfac)_2, the S2p X-ray photoelectron spectroscopy spectrum shifts from 163.7 eV (before dosing) to 162.8 eV (after dosing), which gives evidence of Pd—S interfacial bonding.
机译:已经发明了一种新颖的基于等离子体的方法,其中使用硫来增强高度可极化的金属有机物对电介质或阻挡层表面的化学吸附。研究了三种根本不同的基材:金属氧化物(暴露于空气中的Ta和SiO_2),混合电介质(Trikon)和聚合物材料(SiLK)。可以相对轻松地修改所有表面,从而实现与基材无关的过程。此外,将六氟乙酰丙酮钯(Ⅱ)在34.8℃和175℃的升华温度下加到正在研究的基材上。结果表明,在硫沉积过程中,提高的rf功率和降低的系统压力会导致较大的相对百分比还原硫,例如在SiO_2表面。反过来,这导致更多的钯从较大的Pd 3d / Si 2p比值化学吸附到表面。当通过H_2S和He在300 W至700 W范围内沉积硫时,使用Rutherford背散射光谱法估计了暴露于空气的Ta上的硫面密度约为1 x 10〜(15)原子/ cm〜2射频功率为60 mTorr。结果表明,硫活化的表面在环境条件下是稳定的。同样,在硫活化的SiO_2表面上加入Pd〜Ⅱ(hfac)_2后,S2p X射线光电子能谱从163.7 eV(加药前)转变为162.8 eV(加药后),这证明了Pd- S界面结合。

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