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Electronic structure of InAs quantum dots with GaAsSb strain reducing layer: Localization of holes and its effect on the optical properties

机译:具有GaAsSb应变降低层的InAs量子点的电子结构:空穴的局限性及其对光学性能的影响

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The electronic structure of InAs quantum dots covered with the GaAs1−ySby strain reducing layer has been studied using the ⋅ theory. We explain previous experimental observations of the red shift of the photoluminescence emission with increasing y and its blue shift with increasing excitation power. For y>0.19, type-II dots are formed with holes localized in the GaAsSb close to the dot base; two segments at the opposite sides of the dot, forming molecular-like states, result from the piezoelectric field. We also propose an experiment that could be used to identify the hole localization using a vertical electric field.
机译:利用⋅理论研究了被GaAs1-ySby应变减小层覆盖的InAs量子点的电子结构。我们解释了以前的实验观察,即随着y的增加,光致发光发射的红移和随着激发功率的增加的蓝移。对于y> 0.19,II型点形成有GaAsSb中靠近点基的局部孔;压电场产生了点相对两侧的两个段,形成分子状状态。我们还提出了一个实验,该实验可用于使用垂直电场识别孔的位置。

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