Intrinsic piezoelectricity of monolayer group Ⅳ-Ⅴ MX_2: SiP_2, SiAs_2, GeP_2, and GeAs_2

摘要

The intrinsic piezoelectric effect of the monolayer group IV-V MX2 (M = Si, Ge and X = P, As) is systematically investigated using the density functional theory based on first-principles calculations and the modern theory of polarization. We find that the piezoelectric coefficients d(11)(2D) of the compounds are approximately one order of magnitude larger than those of other 2D materials, such as hexagonal boron nitride and MoS2, which have been widely studied both experimentally and theoretically. Furthermore, the coefficients d(11)(2D) are always one order of magnitude larger than d(12)(2D), showing obvious anisotropy. Such strong anisotropy can be easily understood by the C-2v symmetry and puckered configuration along the a direction, which leads to considerable flexibility. Our results show that these monolayers of group IV-V MX2 have potential for applications in nanosized sensors, piezotronics, and energy-harvesting in portable electronic nanodevices. Owing to the recent advances in synthesis technologies, it is expected that these monolayers may be put to a wide practical use in the future. Published under license by AIP Publishing.