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Quantitative electrostatic force microscopy on heterogeneous nanoscale samples

机译:异质纳米级样品上的定量静电力显微镜

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Locally resolved electrostatic force spectroscopy is combined with Kelvin force microscopy to compare the results obtained using either the force or the frequency as signal source for tip-sample interaction. A two-component locally heterogeneous sample—islands of octadecanethiol molecules self-assembled on Au(111)—is used as a nanometer scale model system. On this kind of sample, electrostatic force spectroscopy as well as Kelvin force microscopy clearly demonstrate that local and quantitative electrostatic force microscopy has to be implemented with the frequency as the signal source.
机译:局部分辨静电力谱与开尔文力显微镜相结合,比较使用力或频率作为尖端样品相互作用的信号源获得的结果。两组分的局部异质样品—在Au(111)上自组装的十八烷硫醇分子的岛—被用作纳米尺度模型系统。在这种样品上,静电力谱以及开尔文力显微镜清楚地表明,必须以频率为信号源来实施局部和定量静电力显微镜。

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