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NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy

机译：使用峰力分接原子力显微镜的纳米级定量力学性能映射。

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来源
《》|2010年|p.464-465|共2页
会议地点 Portland OR(US)
作者
S. C. Minne; Y. Hu; S. Hu; B. Pittenger; C. Su;
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作者单位

Veeco Instruments, 112 Robin Hill Road, Santa Barbara, CA 93110;

Veeco Instruments, 112 Robin Hill Road, Santa Barbara, CA 93110;

Veeco Instruments, 112 Robin Hill Road, Santa Barbara, CA 93110;

Veeco Instruments, 112 Robin Hill Road, Santa Barbara, CA 93110;

Veeco Instruments, 112 Robin Hill Road, Santa Barbara, CA 93110;

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会议组织
原文格式 PDF
正文语种 eng
中图分类显微镜;
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2. Simultaneous Nanomechanical and Electrochemical Mapping: Combining Peak Force Tapping Atomic Force Microscopy with Scanning Electrochemical Microscopy [J] . Knittel Peter, Mizaikoff Boris, Kranz Christine Analytical chemistry . 2016,第12期

机译：同时纳米力学和电化学映射：结合峰力攻丝原子力显微镜与扫描电化学显微镜。
3. Quantitative Nanoscale Mapping with Temperature Dependence of the Mechanical and Electrical Properties of Poly(3-hexylthiophene) by Conductive Atomic Force Microscopy [J] . Wood Dawn, Hancox Ian, Jones Tim S., The journal of physical chemistry, C. Nanomaterials and interfaces . 2015,第21期

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4. Mapping Quantitative Mechanical Properties at Molecular Scale Using Peak Force Tapping AFM [C] . Chanmin Su Microscopy and microanalysis.;Microscopy and microanalysis. . 2010

机译：使用峰值力攻AFM在分子尺度上绘制定量力学性能
5. Quantitative prediction of tip-sample repulsive forces and sample deformation in tapping-mode frequency and force modulation atomic force microscopy. [D] . Crone, Joshua C. 2008

机译：敲击模式频率和力调制原子力显微镜中尖端样本排斥力和样本变形的定量预测。
6. Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping [O] . Marie E. Kroeger, Blaire A. Sorenson, J. Santoro Thomas, 2014

机译：使用PeakForce定量纳米力学性质映射的红光感光体原子力显微镜
7. NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy [O] . SC Minne, Y Hu, S Hu, 2010

机译：纳米级定量力学性能映射，使用峰值攻丝原子力显微镜显微镜

NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy

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