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Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy

机译:通过频率调制静电力显微镜对纳米结构聚合物中的介电弛豫进行成像

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摘要

We have developed a method for imaging the temperature-frequency dependence of the dynamics of nanostructured polymer films with spatial resolution. This method provides images with dielectric compositional contrast well decoupled from topography. Using frequency-modulation electrostatic-force-microscopy, we probe the local frequency-dependent (0.1-100 Hz) dielectric response through measurement of the amplitude and phase of the force gradient in response to an oscillating applied electric field. When the phase is imaged at fixed frequency, it reveals the spatial variation in dielectric losses, i.e., the spatial variation in molecular/dipolar dynamics, with 40 nm lateral resolution. This is demonstrated by using as a model system; a phase separated polystyrene/poly vinyl-acetate (PVAc) blend. We show that nanoscale dynamic domains of PVAc are clearly identifiable in phase images as those which light-up in a band of temperature, reflecting the variations in the molecular/dipolar dynamics approaching the glass transition temperature of PVAc.
机译:我们已经开发出一种用于成像的具有空间分辨率的纳米结构聚合物薄膜动力学的温度-频率依赖性的方法。此方法提供的介电成分对比度与地形完全分离的图像。使用调频静电力显微镜,我们通过测量响应于振荡电场的力梯度的幅度和相位来探查局部频率相关(0.1-100 Hz)的介电响应。当相位以固定频率成像时,它显示出介电损耗的空间变化,即分子/偶极动力学的空间变化,横向分辨率为40 nm。通过使用作为模型系统来证明这一点;相分离的聚苯乙烯/聚醋酸乙烯酯(PVAc)混合物。我们显示,在相图像中可以清楚地识别出PVAc的纳米级动态域,就像在温度带中亮起的那样,反映了接近PVAc的玻璃化转变温度的分子/偶极动力学的变化。

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  • 来源
    《Applied Physicsletters》 |2010年第21期|P.213110.1-213110.3|共3页
  • 作者单位

    Institut d'Electronique du Sud (IES), UMR CNRS 5214, Universite Montpellier II, CC 082, Place E. Bataillon, 34095 Montpellier Cedex, France Departamento de Fisica de Materiales, Facultad de Quimica, UPV/EHU, Apartado 1072, 20080 San Sebastian, Spain and Donostia International Physics Center, Paseo Manuel de Lardizabal 4, 20018 San Sebastian, Spain;

    rnDepartment of Physics, Northeastern University, Boston, Massachusetts 02115, USA;

    Department of Physics, Northeastern University, Boston, Massachusetts 02115, USA;

    Institut d'Electronique du Sud (IES), UMR CNRS 5214, Universite Montpellier II, CC 082, Place E. Bataillon, 34095 Montpellier Cedex, France;

    rnCentro de Fisica de Materiales CSIC-UPV/EHU, Edificio Korta, 20018 San Sebastian, Spain;

    rnDepartamento de Fisica de Materiales, Facultad de Quimica, UPV/EHU, Apartado 1072, 20080 San Sebastian, Spain and Donostia International Physics Center, Paseo Manuel de Lardizabal 4, 20018 San Sebastian, Spain;

    rnInstitut de Mecanique des Fluides (IMFT), Universite de Toulouse-CNRS, 1 Allee du Professeur Camille Soula, 31400 Toulouse, France;

    rnDepartamento de Fisica de Materiales, Facultad de Quimica, UPV/EHU, Apartado 1072, 20080 San Sebastian, Spain and Donostia International Physics Center, Paseo Manuel de Lardizabal 4, 20018 San Sebastian, Spain Centro de Fisica de Materiales CSIC-UPV/EHU, Edificio Korta, 20018 San Sebastian, Spain;

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