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Frequency modulation detection for photo induced force microscopy
Frequency modulation detection for photo induced force microscopy
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机译:照片诱导力显微镜的调频检测
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摘要
An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip-sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.
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