Chapter 1 Introduction
1.1 Significance of the study
1.2 Background
1.3 Imaging techniques of micro and nano sidewall structures
1.4 AFM imaging of micro and nano sidewall structures
1.5 Measurement uncertainty and its sources
1.6 Objective
1.7 Thesis contents
Chapter 2 Sidewall imaging with the tilt-scanning method
2.1 Introduction
2.2 Principle of the tilt-scanning method
2.3 Optical fiber probe
2.4 Deep trench imaging capability of the OFP
2.5 Sidewall imaging with the tilted OFP
2.6 Experimental Setup
2.7 Results and discussion
2.8 Summary
Chapter 3 Sidewall imaging with a quartz tuning fork force sensor
3.1 Introduction
3.2 Quartz tuning fork force sensor
3.3 Fabrication of the light-weight tungsten tips
3.4 Preparation of QTF force sensor
3.5 Amplitude calibration of the QTF sensor
3.6 Orthogonal sidewall scanning scheme with the QTF sensor
3.7 Experimental results and discussions
3.8 Summary
Chapter 4 AFM dual-probe caliper for imaging adjacent sidewalls
4.1 Introduction
4.2 Challenges in the imaging of the adjacent sidewalls
4.3 Atomic force microscopy dual-probe caliper
4.4 Results and discussions
4.5 Summary
Chapter 5 Three-dimensional AFM imaging of sidewall structures
5.1 Introduction
5.2 Principle of 3D-AFM imaging with controllable scan density
5.3 Vector probing scanning scheme
5.4 Vector angle prediction with the B-Spline fit
5.5 True three-dimensional atomic force microscope
5.6 Results and discussions
5.7 Summary
Conclusion
结论
参考文献
Papers published in the period of PHD study
声明
致谢
Resume