机译:薄硅酸ha和氮化硅酸gate栅电介质叠层中的电子俘获
Institute of Mechatronic Engineering, National Taipei University of Technology, No. 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan;
Department of Physics, Vidyasagar College for Women, 39 Sankar Ghosh Lane, Kolkata 700 006, India;
Institute of Mechatronic Engineering, National Taipei University of Technology, No. 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan;
Institute of Mechatronic Engineering, National Taipei University of Technology, No. 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan;
Department of Mechatronic Technology, National Taiwan Normal University, No. 162, Sec. 1, He-Ping E. Rd., Taipei 106, Taiwan;
机译:静态和动态应力下Ha硅酸盐栅堆叠中的电荷俘获和俘获特性
机译:利用反转脉冲测量技术在硅酸ha栅极电介质中的电荷俘获和去俘获特性
机译:使用硅酸锆和硅酸Ha薄膜复合材料作为栅极电介质的环保型柔性金属绝缘体金属电容器
机译:MOCVD硅酸G门介质层结构中的电荷俘获和电子迁移率退化。
机译:基于氮化钛/硅酸af的栅极堆叠的可靠性研究。
机译:掺Pr3 +的硅酸ha薄膜的微观结构和光学性质
机译:超薄铪硅酸盐/金属栅堆叠中的电荷俘获
机译:氧化铪,硅酸镉和碳化铪的参考文献