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Influence of aluminium doping on thermoelectric performance of atomic layer deposited ZnO thin films

机译:铝掺杂对原子层沉积ZnO薄膜热电性能的影响

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摘要

We study the effect of Al doping on thermoelectric power factor of ZnO films grown using atomic layer deposition method. The overall doping level is tuned by either varying the precursor pulsing sequence or by varying the number of precursor pulses while keeping the sequence unchanged. We observe that commonly utilized doping approach when periodic dopant layers are densely packed results in reduced power factor. At the same time, we find that thermoelectric performance can be improved by clustering the dopants. In addition, the clustering was found to tune the preferred crystal orientation of the polycrystalline film.
机译:我们研究了铝掺杂对原子层沉积法生长的ZnO薄膜热电功率因数的影响。通过改变前驱脉冲序列或通过改变前驱脉冲数,同时保持序列不变,可以调整总掺杂水平。我们观察到,当周期性掺杂剂层密集堆积时,常用的掺杂方法会导致功率因数降低。同时,我们发现通过聚集掺杂剂可以改善热电性能。另外,发现聚簇可调节多晶膜的优选晶体取向。

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  • 来源
    《Applied Physics Letters》 |2013年第20期|203903.1-203903.4|共4页
  • 作者单位

    Department of Micro- and Nanosciences, Aalto University, FI-00076 Aalto, Finland;

    Department of Micro- and Nanosciences, Aalto University, FI-00076 Aalto, Finland;

    Department of Micro- and Nanosciences, Aalto University, FI-00076 Aalto, Finland;

    Department of Micro- and Nanosciences, Aalto University, FI-00076 Aalto, Finland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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