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High performance nonvolatile memory devices based on Cu_(2-x)Se nanowires

机译:基于Cu_(2-x)Se纳米线的高性能非易失性存储设备

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We report on the rational synthesis of one-dimensional Cu_(2-x)Se nanowires (NWs) via a solution method. Electrical analysis of Cu_(2-x)Se NWs based memory device exhibits a stable and reproducible bipolar resistive switching behavior with a low set voltage (0.3-0.6 V), which can enable the device to write and erase data efficiently. Remarkably, the memory device has a record conductance switching ratio of 10~8, much higher than other devices ever reported. At last, a conducting filaments model is introduced to account for the resistive switching behavior. The totality of this study suggests that the Cu_(2-x)Se NWs are promising building blocks for fabricating high-performance and low-consumption nonvolatile memory devices.
机译:我们报告通过解决方法的一维Cu_(2-x)Se纳米线(NWs)的合理合成。基于Cu_(2-x)Se NWs的存储设备的电学分析显示出稳定且可重现的双极电阻切换行为,并且具有低设置电压(0.3-0.6 V),这可使该设备高效地写入和擦除数据。值得注意的是,该存储设备的电导记录转换比为10〜8,远高于其他已报道的设备。最后,引入导电丝模型来说明电阻切换行为。这项研究的总体结果表明,Cu_(2-x)Se纳米线是制造高性能和低功耗非易失性存储器件的有前途的构建基块。

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  • 来源
    《Applied Physics Letters》 |2013年第19期|193501.1-193501.4|共4页
  • 作者单位

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

    School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices, Hefei University of Technology, Hefei, Anhui 230009,People's Republic of China;

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  • 正文语种 eng
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