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Enhanced ultraviolet electroluminescence and spectral narrowing from ZnO quantum dots/GaN heterojunction diodes by using high-κ HfO_2 electron blocking layer

机译:通过使用高κHfO_2电子阻挡层增强ZnO量子点/ GaN异质结二极管的紫外电致发光和光谱范围

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摘要

We demonstrated the capability of realizing enhanced ZnO-related UV emissions by using the low-cost and solution-processable ZnO quantum dots (QDs) with the help of a high-κ HfO_2 electron blocking layer (EBL) for the ZnO QDs/p-GaN light-emitting diodes (LEDs). Full-width at half maximum of the LED devices was greatly decreased from ~110 to ~54 nm, and recombinations related to nonradiative centers were significantly suppressed with inserting HfO_2 EBL. The electroluminescence of the ZnO QDs/HfO_2/p-GaN LEDs demonstrated an interesting spectral narrowing effect with increasing HfO_2 thickness. The Gaussian fitting revealed that the great enhancement of the Zn_i-related emission at ~414 nm whereas the deep suppression of the interfacial recombination at ~477 nm should be the main reason for the spectral narrowing effect.
机译:我们展示了借助低成本和可溶液处理的ZnO量子点(QD),并借助用于ZnO QDs / p-的高κHfO_2电子阻挡层(EBL)来实现增强的ZnO相关UV发射的能力。 GaN发光二极管(LED)。 LED器件的半峰全宽从〜110 nm减小到〜54 nm,并且通过插入HfO_2 EBL显着抑制了与非辐射中心相关的重组。 ZnO QDs / HfO_2 / p-GaN LED的电致发光显示出随着HfO_2厚度的增加而产生的有趣的光谱变窄效应。高斯拟合表明,在〜414 nm处Zn_i相关发射的极大增强,而在〜477 nm处界面复合的深度抑制应是引起光谱变窄效果的主要原因。

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  • 来源
    《Applied Physics Letters》 |2014年第6期|063505.1-063505.5|共5页
  • 作者单位

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China;

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China;

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China;

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China,School of Electronic and Electrical Engineering, Wuhan Textile University, Wuhan 430073, People's Republic of China;

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China;

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China;

    Department of Physics, Institute of Nanoscience and Nanotechnology, Central China Normal University, Wuhan 430079, People's Republic of China;

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China;

    College of Physical Science and Technology, Guangxi University, Nanning, Guangxi 530004, People's Republic of China;

    Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, People's Republic of China;

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