机译:电流瞬态光谱法用于无金AlGaN / GaN肖特基势垒二极管的俘获分析
Department of Electrical Engineering (ESAT), KU Leuven, 3001 Leuven, Belgium,Imec, Kapeldreef 75,3001 Leuven, Belgium;
Imec, Kapeldreef 75,3001 Leuven, Belgium;
Imec, Kapeldreef 75,3001 Leuven, Belgium;
Imec, Kapeldreef 75,3001 Leuven, Belgium,Centre for Microsystems Technology (CMST), imec and Ghent University, Technologiepark 914a, 9052 Gent, Belgium;
Imec, Kapeldreef 75,3001 Leuven, Belgium;
Department of Electrical Engineering (ESAT), KU Leuven, 3001 Leuven, Belgium,Imec, Kapeldreef 75,3001 Leuven, Belgium;
Imec, Kapeldreef 75,3001 Leuven, Belgium;
机译:电流瞬态光谱法对AlGaN / GaN肖特基二极管的陷波分析
机译:C掺杂缓冲层上制造的无金AlGaN / GaN肖特基势垒二极管的泄漏和俘获特性
机译:无金AlGaN / GaN肖特基势垒二极管中电流崩溃的物理原因
机译:Algan / GaN肖特基屏障二极管和MIS电容中慢载体诱捕的观察
机译:用于AlGaN / GaN和InAlN / GaN二极管以及在硅(111)衬底上生长的高迁移率晶体管的CMOS兼容氧化钌肖特基接触的研究。
机译:双异质结硅衬底上AlGaN / GaN肖特基势垒二极管的理论和实验研究
机译:电流瞬态光谱法用于无金AlGaN / GaN肖特基势垒二极管的俘获分析