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N-type control of single-crystal diamond films by ultra-lightly phosphorus doping

机译:超轻磷掺杂对N型单晶金刚石膜的控制

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摘要

A wide impurity doping range of p- and n-type diamond semiconductors will facilitate the development of various electronics. This study focused on producing n-type diamond with ultra-lightly impurity doping concentrations. N-type single-crystal diamond films were grown on (111)-oriented diamond substrates by phosphorus doping using the optimized doping conditions based on microwave plasma-enhanced chemical vapor deposition with a high magnetron output power of 3600 W. The surface morphology was investigated by an optical microscopy using the Nomarski prism and confocal laser microscopy, and the phosphorus concentration was estimated by a secondary ion mass spectrometry. The phosphorus concentration was reproducibly controlled to between 2 × 10~(15) and 3 × 10~(17) cm~(-3) using a standard mass flow controller, and the average incorporation efficiency was around 0.1%. The electrical properties of the films were characterized by the Hall effect measurements as a function of temperature over a wide range from 220 to 900 K. N-type conductivity with thermal activation from a phosphorus donor level at around 0.57 eV was clearly observed for all the phosphorus-doped diamond films. The electron mobility of the film with a phosphorus concentration of 2 × 10~(15) cm~(-3) was recorded at 1060 cm~2/V s at 300 K and 1500 cm~2/V s at 225 K.
机译:p型和n型金刚石半导体的广泛杂质掺杂范围将促进各种电子产品的开发。这项研究的重点是生产具有超轻杂质掺杂浓度的n型金刚石。在基于微波等离子体增强化学气相沉积的高磁控管输出功率3600 W的优化掺杂条件下,通过磷掺杂在(111)取向金刚石衬底上生长N型单晶金刚石膜。研究了表面形态通过使用Nomarski棱镜的光学显微镜和共聚焦激光显微镜观察,磷浓度通过二次离子质谱法估算。使用标准质量流量控制器将磷浓度可再现地控制在2×10〜(15)和3×10〜(17)cm〜(-3)之间,平均掺入效率约为0.1%。薄膜的电学特性通过霍尔效应测量在220至900 K的宽范围内随温度变化而表征。在所有温度范围内,均清楚地观察到N型电导率和磷供体能级在0.57 eV左右的热活化。掺磷金刚石薄膜。磷浓度为2×10〜(15)cm〜(-3)的薄膜的电子迁移率在300 K时为1060 cm〜2 / V s,在225 K下为1500 cm〜2 / V s记录。

著录项

  • 来源
    《Applied Physics Letters》 |2016年第14期|142102.1-142102.5|共5页
  • 作者单位

    Advanced Power Electronics Research Center, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

    Advanced Power Electronics Research Center, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

    Advanced Power Electronics Research Center, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

    Advanced Power Electronics Research Center, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

    Advanced Power Electronics Research Center, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:14:51

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