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Low-voltage operating flexible ferroelectric organic field-effect transistor nonvolatile memory with a vertical phase separation P(VDF-TrFE-CTFE)/PS dielectric

机译:具有垂直相分离P(VDF-TrFE-CTFE)/ PS电介质的低压工作柔性铁电有机场效应晶体管非易失性存储器

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摘要

Future flexible electronic systems require memory devices combining low-power operation and mechanical bendability. However, high programming/erasing voltages, which are universally needed to switch the storage states in previously reported ferroelectric organic field-effect transistor (Fe-OFET) nonvolatile memories (NVMs), severely prevent their practical applications. In this work, we develop a route to achieve a low-voltage operating flexible Fe-OFET NVM. Utilizing vertical phase separation, an ultrathin self-organized poly(styrene) (PS) buffering layer covers the surface of the ferroelectric polymer layer by one-step spin-coating from their blending solution. The ferroelectric polymer with a low coercive field contributes to low-voltage operation in the Fe-OFET NVM. The polymer PS contributes to the improvement of mobility, attributing to screening the charge scattering and decreasing the surface roughness. As a result, a high performance flexible Fe-OFET NVM is achieved at the low P/E voltages of ±10V, with a mobility larger than 0.2 cm~2 V~(-1) s~(-1), a reliable P/E endurance over 150 cycles, stable data storage retention capability over 10~4 s, and excellent mechanical bending durability with a slight performance degradation after 1000 repetitive tensile bending cycles at a curvature radius of 5.5 mm.
机译:未来的柔性电子系统需要结合低功耗操作和机械可弯曲性的存储设备。然而,通常需要高编程/擦除电压来切换先前报道的铁电有机场效应晶体管(Fe-OFET)非易失性存储器(NVM)中的存储状态,严重地妨碍了它们的实际应用。在这项工作中,我们开发了一种途径来实现低电压运行的柔性Fe-OFET NVM。利用垂直相分离,超薄自组织聚(苯乙烯)(PS)缓冲层通过从其混合溶液进行一步旋涂,覆盖了铁电聚合物层的表面。矫顽场低的铁电聚合物有助于Fe-OFET NVM中的低压运行。聚合物PS有助于提高迁移率,归因于屏蔽电荷散射并降低表面粗糙度。结果,在±10V的低P / E电压下获得了高性能的柔性Fe-OFET NVM,迁移率大于0.2 cm〜2 V〜(-1)s〜(-1),是可靠的P / E寿命超过150个循环,稳定的数据存储保持能力超过10〜4 s,出色的机械弯曲耐久性,在曲率半径为5.5 mm的1000次重复拉伸弯曲循环后,性能略有下降。

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  • 来源
    《Applied Physics Letters》 |2017年第18期|183302.1-183302.5|共5页
  • 作者单位

    State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012, China;

    State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012, China;

    State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012, China;

    State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012, China;

    State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012, China;

    Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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