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首页> 外文期刊>Journal of Applied Physics >Surface modification of a ferroelectric polymer insulator for low-voltage readable nonvolatile memory in an organic field-effect transistor
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Surface modification of a ferroelectric polymer insulator for low-voltage readable nonvolatile memory in an organic field-effect transistor

机译:用于有机场效应晶体管中低压可读非易失性存储器的铁电聚合物绝缘体的表面改性

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摘要

We demonstrate that the sequential surface modification of a ferroelectric polymer insulator plays an essential role in both the enhancement of the carrier mobility and the shift in the turn-on voltage (V_on) in an organic ferroelectric field-effect transistor (FeFET) for nonvolatile memory. The surface of a ferroelectric polymer insulator, poly(vinylidene fluoride-trifluoroethylene), is physicochemically modified by the successive treatments of ultraviolet-ozone (UVO) and CF_4 plasma to understand how the surface morphology and the hydrophobicity affect the grain size, the mobility, and V_on in the FeFET. In a pentacene-based FeFET, the CF_4 plasma irradiation leads to the mobility enhancement by a factor of about 5 as well as the shift in V_on toward a positive voltage direction while the UVO treatment results in only the shift in V_on toward a negative voltage direction. It is found that the sequence of the two successive treatments is critical for tailoring interfacial interactions between the ferroelectric polymer insulator and the pentacene layer. The underlying mechanism for the mobility enhancement and the shift in V_on is described in terms of the surface morphology and the nature of the built-in electric field.
机译:我们证明,铁电聚合物绝缘体的顺序表面改性在提高载流子迁移率和非易失性存储器用有机铁电场效应晶体管(FeFET)的导通电压(V_on)的偏移中起着至关重要的作用。铁电聚合物绝缘体聚偏二氟乙烯-三氟乙烯的表面通过紫外臭氧(CFO)和CF_4等离子体的连续处理进行了物理化学修饰,以了解表面形态和疏水性如何影响晶粒尺寸,迁移率, FeFET中的V_on。在并五苯FeFET中,CF_4等离子体辐照导致迁移率提高约5倍,同时V_on向正电压方向移动,而UVO处理仅导致V_on向负电压方向移动。 。发现两个连续处理的顺序对于调整铁电聚合物绝缘体和并五苯层之间的界面相互作用至关重要。根据表面形貌和内置电场的性质描述了迁移率增强和V_on漂移的基本机制。

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  • 来源
    《Journal of Applied Physics》 |2011年第2期|p.024508.1-024508.6|共6页
  • 作者单位

    School of Electrical Engineering, Seoul National University, Kwanak P.O. Box 34, Seoul 151-600,Republic of Korea;

    School of Electrical Engineering, Seoul National University, Kwanak P.O. Box 34, Seoul 151-600,Republic of Korea;

    School of Electrical Engineering, Seoul National University, Kwanak P.O. Box 34, Seoul 151-600,Republic of Korea;

    School of Electrical Engineering, Seoul National University, Kwanak P.O. Box 34, Seoul 151-600,Republic of Korea;

    School of Electrical Engineering, Seoul National University, Kwanak P.O. Box 34, Seoul 151-600,Republic of Korea;

    School of Electrical Engineering, Seoul National University, Kwanak P.O. Box 34, Seoul 151-600,Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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